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Atomic Force Microscope II

equipment explanation
Model AFM 5000 II
Operating time SUN(00:00~24:00)
MON(00:00~24:00)
TUE(00:00~24:00)
WED(00:00~24:00)
THU(00:00~24:00)
FRI(00:00~24:00)
SAT(00:00~24:00)
Location 86595
inquiry Suar Oh
010-7176-9644
saoh30@skku.edu
Reservation

Notice



@@@@@@ Please let me know when you want to use this instrument. @@@@@@


1. Reservation time has limit 6 hours.


2. Over 6 hours reservation, Contact Superuser. Please be aware.


3. If you want to have education about this machine, please contact superuser.


4. File format is not compatible with our original programs. Please be aware.

Atomic force microscopy is general term for a microscope that performs material analysis and surface topography observation of microscopic areas using a probe that scans near the sample surface and detects the physical characteristics

 

 

// Specification //

 

- 100 x 100 [um] Scanner size

- AFM (Atomic Force Microscope)

- DFM (Dynamic Force Microscope)

 

- Stage Movement : X = 35[mm], Y = 35[mm]

- Simultaneous Measuring : 8192 x 1024 x 4 window

 

- Function : Auto gain control

                  Z scan limiter

 

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