Center for Relativistic Laser Science

Unit content

- 10 x 10 μm scanner
- 125 x 125 μm scanner
- Vacuum: low 10-6 torr (Seiko, NT-MDT)
- Sample stage: -100 ~ 800 oC (Seiko)
- Force curve mapping (Bruker)
- Low current amplifier : 100fA
- Magnetic force microscopy
- Lateral force microscopy
- Contact and non-contact mapping
- Electrochemistry fluid cell
- Scanning tunneling microscopy
- Nanolithography
- Fast scanning mode: 6~20 X 일반 AFM scan속도 (Bruker)
- In situ I-V 측정